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JIS R 1636:1998
Original price was: $29.00.$14.50Current price is: $14.50.
Test method for thickness of fine ceramic thin films — Film thickness by contact probe profilometer (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
Description
Product Details
- Published:
- 01/01/1998
- File Size:
- 1 file , 420 KB
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